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On the injection level dependence of the minority carrier lifetime in defected silicon substrates : P. de Pauw, R. Mertens, R. van Overstraeten and S. C. Jain. Solid-St. Electron.27, 573 (1984)


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
120 KB
Volume
25
Category
Article
ISSN
0026-2714

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