Investigation of Defect Levels in Mg-Doped GaN Schottky Structures by Thermal Admittance Spectroscopy

✍ Scribed by N.D. Nguyen; M. Germain; M. Schmeits; B. Schineller; M. Heuken

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 119 KB
• Volume: 228
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/1521-3951(200111)228:2<385::aid-pssb385>3.0.co;2-6