𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Double–Single Stuck-at Faults: A Delay Fault Model for Synchronous Sequential Circuits

✍ Scribed by Pomeranz, I.; Reddy, S.M.

Book ID
117908194
Publisher
IEEE
Year
2009
Tongue
English
Weight
223 KB
Volume
28
Category
Article
ISSN
0278-0070

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Stuck-at-fault testing for quasi-delay-i
Stuck-at-fault testing for quasi-delay-insensitive logic circuits
✍ Arthit Thongtak; Takashi Nanya 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 186 KB 👁 1 views

In Quasi-Delay-Insensitive (QDI) circuits, some single stuck-at-faults may cause run-away transitions without stopping normal transitions. This paper clarifies problems in detecting such stuck-at-faults and proposes a method for generating test sequences for these problems. In this method, a test se

A method of diagnosing single stuck-at f
A method of diagnosing single stuck-at faults in combinational circuits
✍ Teruhiko Yamada; Yoshiyuki Nakamura 📂 Article 📅 1992 🏛 John Wiley and Sons 🌐 English ⚖ 618 KB

## Abstract A new method is proposed to diagnose single stuck‐at faults in combinational circuits. In this method, based on the operations of the nonfaulty circuit, first the possible faulty paths are examined from the primary outputs, at which errors have been observed, toward the primary inputs t

An algorithm for stuck-at fault coverage
An algorithm for stuck-at fault coverage analysis of combinational and sequential logic circuits
✍ Leonard J. Tung 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 726 KB

An algorithm for stuck-at fault coverage analysis of digital logic circuits is presented. Based on a recently developed stuck-at fault model, the algorithm determines the effectiveness of a given test input set. The algorithm is applicable for studying sequential logic circuits, as well as combinati