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Dopant profile and gate geometric effects on polysilicon gate depletion in scaled MOS

✍ Scribed by Chang-Hoon Choi; Chidambaram, P.R.; Khamankar, R.; Machala, C.F.; Zhiping Yu; Dutton, R.W.


Book ID
114616774
Publisher
IEEE
Year
2002
Tongue
English
Weight
389 KB
Volume
49
Category
Article
ISSN
0018-9383

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