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Impact of nonuniform graded dopant profile in polysilicon gate on gate leakage current

โœ Scribed by Sarkar, M.; Ang Chew Hoe; Huang Jiayi; Chen, T.P.


Book ID
114617810
Publisher
IEEE
Year
2005
Tongue
English
Weight
363 KB
Volume
52
Category
Article
ISSN
0018-9383

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