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DLTS Investigations of Si–SiO2 Interface States of Electron-Beam Irradiated MOS Structures

✍ Scribed by K. Hübner; H. Köster Jr.; B. Derlich; W. Ecke


Publisher
John Wiley and Sons
Year
1983
Tongue
English
Weight
189 KB
Volume
118
Category
Article
ISSN
0370-1972

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