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Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscopy

✍ Scribed by S. Morita; Y. Fukano; T. Uchihashi; Y. Sugawara; Y. Yamanishi; T. Oasa

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 365 KB
Volume: 75
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(94)90152-x

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