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Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study

✍ Scribed by Deeder Aurongzeb

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 199 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2005.07.026

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Growth instability and surface phase transition of Ti thin film on Si(1&#xa0;1&#xa0;1): An atomic force microscopy study

Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study