✦ LIBER ✦
Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization
✍ Scribed by M. Esmaeelpour; G. Kavei
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 385 KB
- Volume
- 252
- Category
- Article
- ISSN
- 0169-4332
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