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Diffusion length measurements of thin amorphous silicon layers

✍ Scribed by J.C. van den Heuvel; R.C. van Oort; M.J. Geerts

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 241 KB
Volume: 69
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(89)90269-x

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