✦ LIBER ✦
Diffusion length measurements of thin amorphous silicon layers : J. C. Van Den Heuvel, R. C. Van Oort and M. J. Geerts. Solid St. Commun. 69(8), 807 (1989)
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 129 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0026-2714
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