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Diffusion and defect annealing in silicon doped by phosphorus ion implantation

✍ Scribed by Titov, V. V.


Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
400 KB
Volume
2
Category
Article
ISSN
0031-8965

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Defect production and annealing in ion i
✍ A. Heft; E. Wendler; T. Bachmann; E. Glaser; W. Wesch πŸ“‚ Article πŸ“… 1995 πŸ› Elsevier Science 🌐 English βš– 375 KB

In the present study we investigated damage production and annealing in 6H SiC wafers implanted with 230 keV Ga + ions in a wide dose range at various temperatures. Analysis of the implanted layers was performed by the Rutherford backscattering (RBS) channeling technique and by transmission electron