Microfabricated cantilevers for atomic force microscopy (AFM), used as scanning near-Γeld optical microscopy (SNOM) probes, have remarkable advantages because the fabrication process is well established. In addition, the SNOM probe can be combined with an atomic fore microscope, which is capable of
β¦ LIBER β¦
Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays
β Scribed by Ozcan, A.; Cubukcu, E.; Bilenca, A.; Bouma, B.E.; Capasso, F.; Tearney, G.J.
- Book ID
- 114570402
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 459 KB
- Volume
- 13
- Category
- Article
- ISSN
- 1077-260X
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Scanning near-field optical microscopy u
β
Yamada, H.; Itoh, H.; Watanabe, S.; Kobayashi, K.; Matsushige, K.
π
Article
π
1999
π
John Wiley and Sons
π
English
β 320 KB
π 2 views
Near-field scanning optical microscopy u
β
H. Chibani; K. Dukenbayev; M. Mensi; S.K. Sekatskii; G. Dietler
π
Article
π
2010
π
Elsevier Science
π
English
β 341 KB
Field-enhanced scanning near-field optic
β
Alexandre Bouhelier
π
Article
π
2006
π
John Wiley and Sons
π
English
β 741 KB
## Abstract This manuscript reviews the principles and recent advances of scanning nearβfield optical microscopy based on tipβinduced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e
Piezoresistive cantilevers as optical se
β
P. Bauer; B. Hecht; C. Rossel
π
Article
π
1995
π
Elsevier Science
π
English
β 354 KB
Contact scanning near-field optical micr
β
D. A. Lapshin; S. K. Sekatskii; V. S. Letokhov; V. N. Reshetov
π
Article
π
1998
π
SP MAIK Nauka/Interperiodica
π
English
β 228 KB
Two-dimensional refractive index profili
β
Tsai, Wan-Shao; Wang, Way-Seen; Wei, Pei-Kuen
π
Article
π
2007
π
American Institute of Physics
π
English
β 726 KB