Scanning near-field optical microscopy u
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Yamada, H.; Itoh, H.; Watanabe, S.; Kobayashi, K.; Matsushige, K.
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Article
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1999
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John Wiley and Sons
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English
โ 320 KB
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Microfabricated cantilevers for atomic force microscopy (AFM), used as scanning near-รeld optical microscopy (SNOM) probes, have remarkable advantages because the fabrication process is well established. In addition, the SNOM probe can be combined with an atomic fore microscope, which is capable of