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Optically trapped non-linear particles as probes for scanning near-field optical microscopy

✍ Scribed by H.M. Hertz; L. Malmqvist; L. Rosengren; K. Ljungberg


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
353 KB
Volume
57
Category
Article
ISSN
0304-3991

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## Abstract This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few