✦ LIBER ✦

Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy

✍ Scribed by Renaud Bachelot; Gilles Lerondel; Sylvain Blaize; Sebastien Aubert; Aurelien Bruyant; Pascal Royer

Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 546 KB
Volume: 64
Category: Article
ISSN: 1059-910X
DOI: 10.1002/jemt.20102

No coin nor oath required. For personal study only.

✦ Synopsis

Abstract

This report presents the Apertureless Scanning Optical Near‐Field Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with sub‐wavelength resolution. We present an overview of the results we obtained in our laboratory over the past few years. By significant examples, it is shown that this specific probe microscopy allows for in situ local quantitative study of semiconductor lasers in operation, integrated optical waveguides produced by ion exchange (single channel or Y junction), and photonic structures. Microsc. Res. Tech. 64:441–452, 2004. © 2004 Wiley‐Liss, Inc.

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