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Scanning near-field optical microscopy by near-field reflectance enhancement: a versatile and valid technique

โœ Scribed by Gerd Kaupp; Andreas Herrmann

Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
62 KB
Volume
12
Category
Article
ISSN
0894-3230

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โœฆ Synopsis

The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the enhancement when approached close to shear-force distance. However, sharp uncoated tips continue to show up the near-field enhancement, and chemical contrast on rough surfaces continues to be of basic value at submicroscopic resolution. It is pointed out how a good tip may be immediately differentiated from a broken one.

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