๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Improved Probes for Scanning Near-Field Optical Microscopy

โœ Scribed by Y. D. Suh; R. Zenobi


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
254 KB
Volume
12
Category
Article
ISSN
0935-9648

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๐Ÿ“œ SIMILAR VOLUMES


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The validity of reflection-back-to-the-fiber SNOM (scanning near-field optical microscopy) has been unduely questioned by an erratic approach curve that disputed the enhancement of near-field reflectance. It is shown now that only truncated (broken) tips without metal coating do not experience the e