✦ LIBER ✦

Two-dimensional refractive index profiling by using differential near-field scanning optical microscopy

✍ Scribed by Tsai, Wan-Shao; Wang, Way-Seen; Wei, Pei-Kuen

Book ID: 120042183
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 726 KB
Volume: 91
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2769396

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Differential Near-Field Scanning Optical

Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays

✍ Ozcan, A.; Cubukcu, E.; Bilenca, A.; Bouma, B.E.; Capasso, F.; Tearney, G.J. 📂 Article 📅 2007 🏛 IEEE 🌐 English ⚖ 459 KB

Refractive index profiling of optical fi

Refractive index profiling of optical fibers using differential interference contrast microscopy

✍ Dragomir, N.M.; Ampem-Lassen, E.; Huntington, S.T.; Baxter, G.W.; Roberts, A.; F 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 314 KB

Determination of optical fiber refractiv

Determination of optical fiber refractive index profiles by a near-field scanning technique

✍ Sladen, F. M. E.; Payne, D. N.; Adams, M. J. 📂 Article 📅 1976 🏛 American Institute of Physics 🌐 English ⚖ 619 KB

Direct characterization of ultraviolet-l

Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

✍ Svalgaard, M.; Madsen, S.; Hvam, J.M.; Kristensen, M. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 65 KB

Erratum: Determination of optical fiber

Erratum: Determination of optical fiber refractive index profiles by a near-field scanning technique

✍ Sladen, F. M. E.; Payne, D. N.; Adams, M. J. 📂 Article 📅 1976 🏛 American Institute of Physics 🌐 English ⚖ 335 KB

Beam profiling by vibrating knife edge:

Beam profiling by vibrating knife edge: Implications for near-field optical scanning microscopy

✍ A. Korpel; D. J. Mehrl; S. Samson 📂 Article 📅 1990 🏛 John Wiley and Sons 🌐 English ⚖ 490 KB

We show theoretically and experimentally that beam profiling with a vibrating knife exhibits spatial resolution equal to the knife-edge excursion. We discuss the implications of this for near-field optical scanning microscopy, propose an extension of the method to two dimensions, and calculate impul