## Abstract This manuscript reviews the principles and recent advances of scanning nearβfield optical microscopy based on tipβinduced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon e
β¦ LIBER β¦
Contact scanning near-field optical microscopy
β Scribed by D. A. Lapshin; S. K. Sekatskii; V. S. Letokhov; V. N. Reshetov
- Book ID
- 110146515
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 1998
- Tongue
- English
- Weight
- 228 KB
- Volume
- 67
- Category
- Article
- ISSN
- 0021-3640
- DOI
- 10.1134/1.567661
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Microfabricated cantilevers for atomic force microscopy (AFM), used as scanning near-Γeld optical microscopy (SNOM) probes, have remarkable advantages because the fabrication process is well established. In addition, the SNOM probe can be combined with an atomic fore microscope, which is capable of