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Dielectric constant and stability of fluorine doped PECVD silicon oxide thin films

โœ Scribed by S Mizuno; A Verma; H Tran; P Lee; B Nguyen


Book ID
107864865
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
525 KB
Volume
283
Category
Article
ISSN
0040-6090

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