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Diagnostic of silicon piezoresistive pressure sensors by low frequency noise measurements

✍ Scribed by Milan M. Jevtić; Miloljub A. Smiljanić

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 605 KB
Volume: 144
Category: Article
ISSN: 0924-4247
DOI: 10.1016/j.sna.2008.02.002

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