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Deuterium pressure dependence of characteristics and hot-carrier reliability of CMOS devices

✍ Scribed by Kangguo Cheng; Jinju Lee; Zhi Chen; Samir Shah; Karl Hess; Joseph W. Lyding; Young-Kwang Kim; Young-Wug Kim; Kuwang Pyuk Suh

No coin nor oath required. For personal study only.

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