✦ LIBER ✦
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors
✍ Scribed by H. Wong; Y. Fu; J.J. Liou; Y. Yue
- Book ID
- 108210792
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 560 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0026-2714
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