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Determination of the stress level in growing NiO films by X-ray diffraction

✍ Scribed by J.C. Pivin; J. Morvan; D. Mairey; J. Mignot

Book ID: 116061191
Publisher: Elsevier Science
Year: 1983
Weight: 233 KB
Volume: 17
Category: Article
ISSN: 0036-9748
DOI: 10.1016/0036-9748(83)90095-9

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