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Determination of the azimuthal orientational spread of GaN films by x-ray diffraction

✍ Scribed by Sun, Yue Jun; Brandt, Oliver; Liu, Tian Yu; Trampert, Achim; Ploog, Klaus H.; Blasing, Jurgen; Krost, Alois

Book ID: 118066819
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 402 KB
Volume: 81
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1531832

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