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Determination of Si δ-Doping Concentration in GaN by Electroreflectance

✍ Scribed by A. Drabińska; K.P. Korona; R. Bożek; A. Babiński; J.M. Baranowski; W. Pacuski; R. Stȩpniewski; T. Tomaszewicz

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
132 KB
Volume
234
Category
Article
ISSN
0370-1972

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