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Determination of microscopic interaction constants by X-ray reflectivity measurements

✍ Scribed by Felix Lehmkühler; Michael Paulus; Simone Streit-Nierobisch; Metin Tolan


Book ID
108132298
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
376 KB
Volume
268
Category
Article
ISSN
0378-3812

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New possibilities for determination of s
✍ Fodchuk, I. ;Balovsyak, S. 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 709 KB

## Abstract New possibilities for research on solids surface morphology by X‐ray reflectivity (XRR) methods are presented. The method for reconstruction of surface geometry fragments is suggested. A series of GaAs crystals with a periodic surface relief and SiO~2~ plates with a random surface relie