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Analysis of light emitting diodes by X-ray reflectivity measurements

✍ Scribed by T. Christ; F. Geffart; B. Glüsen; A. Kettner; G. Lüssem; O. Schäfer; V. Stümpflen; J.H. Wendorff; V.V. Tsukruk

Book ID: 108389069
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 579 KB
Volume: 302
Category: Article
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(96)09542-9

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