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Simultaneous determination of the optical constants and thickness of very thin films by using soft-x-ray reflectance measurements

✍ Scribed by Cao, Jianlin ;Yanagihara, Mihiro ;Yamamoto, Masaki ;Goto, Yoshinori ;Namioka, Takeshi


Book ID
115343313
Publisher
The Optical Society
Year
1994
Tongue
English
Weight
584 KB
Volume
33
Category
Article
ISSN
1559-128X

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