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Optical constants of very thin Pt and Rh films determined from soft-X-ray reflectance and photoelectric yield measurements

✍ Scribed by Takumi Maehara; Mihiro Yanagihara; Masaki Yamamoto; Takeshi Namioka


Book ID
113284529
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
609 KB
Volume
74
Category
Article
ISSN
0168-583X

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