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Determination of layer-thickness variation in periodic multilayer by x-ray reflectivity

✍ Scribed by Jiang, Hui; Zhu, Jingtao; Xu, Jing; Wang, Xiaoqiang; Wang, Zhanshan; Watanabe, Makoto

Book ID: 111931645
Publisher: American Institute of Physics
Year: 2010
Tongue: English
Weight: 538 KB
Volume: 107
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3383037

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