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Thickness and density determination of ultrathin solid films comprising multilayer x‐ray mirrors by x‐ray reflection and fluorescence study

✍ Scribed by Zheludeva, S. I.; Kovalchuk, M. V.; Novikova, N. N.; Bashelhanov, I. V.; Salaschenko, N. N.; Akhsakhalyan, A. D.; Platonov, Yu. Ya.

Book ID: 118053008
Publisher: American Institute of Physics
Year: 1992
Tongue: English
Weight: 775 KB
Volume: 63
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1143010

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