✦ LIBER ✦
Density, thickness and interface roughness of SiO2, TiO2 and Ta2O5 films on BK-7 glasses analyzed by x-ray reflection
✍ Scribed by Martin Hüppauff; Klaus Bange; Bruno Lengeler
- Book ID
- 107864271
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 537 KB
- Volume
- 230
- Category
- Article
- ISSN
- 0040-6090
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