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Determination of generation lifetime and interface state density using a pulsed silicon-insulator-silicon capacitor

✍ Scribed by Hung-Sheng Chen; Sheng S. Li

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 538 KB
Volume: 35
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(92)90240-d

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