Transient isothermal generation at the silicon-silicon oxide interface and the direct determination of interface trap distribution : J. G. Simmons and H. A. Mar. Solid-State Electronics19. 369 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 124 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90711-3