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Design of ICs applying built-in current testing

✍ Scribed by Wojciech Maly; Marek Patyra

Publisher
Springer US
Year
1992
Tongue
English
Weight
828 KB
Volume
3
Category
Article
ISSN
0923-8174

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✦ Synopsis

Built-in Current (BIC)

sensors have proven to be very useful in testing static CMOS ICs. In a number of experimental ICs BIC sensors were able to detect small abnormal Ioo Q currents. This paper discusses the design of the circuit under test and Built-in Current (BIC) sensors, which provide: maximum level of defect detectability, minimum impact of BIC sensor on the performance of the circuit under test and minimum area overhead needed for BIC sensors implementation.

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