4724380 Integrated circuit having a built-in self test design

✍ Scribed by David Burrows; Mark Paraskeva; WilliamL Knight

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 85 KB
• Volume: 28
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(88)90308-3