4949341 Built-in self test method for application specific integrated circuit libraries

✍ Scribed by David Lopez; Toma Colunga

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 88 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90281-b