𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Design for testability techniques for CMOS combinational gates

✍ Scribed by Buonanno, G.; Lombardi, F.; Sciuto, D.; Shen, Y.-N.


Book ID
114544613
Publisher
IEEE
Year
1991
Tongue
English
Weight
630 KB
Volume
40
Category
Article
ISSN
0018-9456

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES