Design for testability techniques for CMOS combinational gates: Buonanno, G, Lombardi, F, Sciuto, D, Shen, Y-N IEEE Trans. Instrum. Meas. Vol 40 No 4 (August 1991) pp 703–708

• Book ID: 103531300
• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 115 KB
• Volume: 15
• Category: Article
• ISSN: 0141-9331
• DOI: 10.1016/0141-9331(91)90018-b