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Derivation of minimum length fault tests for combinational circuits

✍ Scribed by Suresh Rai; K.K. Aggarwal

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 158 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90347-0

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