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An algorithm for minimum length fault tests for combinational circuits : K. K. Aggarwal. Int. J. Electronics45, (6) 641 (1978)

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 129 KB
Volume: 19
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(79)90023-4

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📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 119 KB