EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester

✍ Scribed by Koji Nakamae; Takashi Ishimura; Hiromu Fujioka

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 168 KB
• Volume: 31
• Category: Article
• ISSN: 0882-1666
• DOI: 10.1002/1520-684x(200007)31:8<41::aid-scj5>3.0.co;2-e