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Depth Profiling of Peptide Films with TOF-SIMS and a C 60 Probe

✍ Scribed by Cheng, Juan; Winograd, Nicholas

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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Interfacial phenomena during depth profi

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Depth Profiling of Langmuir−Blodgett Fil

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Depth profiling using C60+ SIMS—Depositi

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Depth profiling of ZrO2/SiO2/Si stacks—a

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