✦ LIBER ✦
TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study
✍ Scribed by N. Wehbe; T. Tabarrant; J. Brison; T. Mouhib; A. Delcorte; P. Bertrand; R. Moellers; E. Niehuis; L. Houssiau
- Book ID
- 112206934
- Publisher
- John Wiley and Sons
- Year
- 2012
- Tongue
- English
- Weight
- 216 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0142-2421
- DOI
- 10.1002/sia.5121
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