Interfacial phenomena during depth profiling with gallium ions: a ToF-SIMS approach

✍ Scribed by Antonino Licciardello; Lucio Renna; Salvatore Pignataro

• Book ID: 101321313
• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 72 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<243::aid-sia754>3.0.co;2-i