✦ LIBER ✦

Depth profiles in SiON and AlON thin films produced by ion implantation

✍ Scribed by M. Jacobs; F. Bodart

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Concentration and depth profiles of elem

✍ G. Murillo; E. Andrade; J.C. Alonso; L. Acosta; M.F. Rocha; E.P. Zavala; R. Poli 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 210 KB

Effects produced by ion bombardment and

✍ L.E. Collins; P.A. O'Connell; J.G. Perkins; F.R. Pontet; P.T. Stroud 📂 Article 📅 1971 🏛 Elsevier Science ⚖ 423 KB

Depth profile analysis for MgB2 thin fil

✍ Nianhua Peng; Christopher Jeynes; Russell M. Gwilliam; Karen J. Kirkby; Roger P. 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 121 KB

ZnO Thin Films with Hole Conduction Prod

✍ A. N. Georgobiani; A. N. Gruzintsev; V. T. Volkov; M. O. Vorob'ev; V. A. Dravin 📂 Article 📅 2004 🏛 Springer 🌐 English ⚖ 93 KB

Study of electronic properties and depth

✍ A. Markwitz; M. Arps; H. Baumann; G. Demortier; E.F. Krimmel; K. Bethge 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 887 KB

Primary ion implantation and recoil impl

✍ M. V. Ciampolillo; C. Sada 📂 Article 📅 2012 🏛 John Wiley and Sons 🌐 English ⚖ 120 KB