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Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings

✍ Scribed by Nianhua Peng; Christopher Jeynes; Russell M. Gwilliam; Karen J. Kirkby; Roger P. Webb


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
121 KB
Volume
460-462
Category
Article
ISSN
0921-4534

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