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Deposition of ZnO films by rf sputtering

✍ Scribed by M.Di Giulio; A. Valentini; L. Vasanelli


Book ID
113299090
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
427 KB
Volume
9
Category
Article
ISSN
0254-0584

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## Abstract Influences of O~2~/Ar flux ratio (__R__) on surface morphology and structural evolution have been studied in the case of ZnO films deposited on glass substrates by radio‐frequency (rf) magnetron sputtering. Results of atomic force microscopy (AFM), X‐ray diffraction, and X‐ray photoelec